JEOL IT800 FE SEM

A Field Emission SEM with a comprehensive suite of analytical capabilities, including the Oxford Instruments Ultim Extreme detector.
JEOL IT800 SEM

Technical specification

Resolution: 0.7 nm (@ 20 kV)
Magnification: 10 - 2,000,000x
Acceleration Voltage: 0.01 - 30 kV

Equipment specification

  • OI Ultimax 65 mm2 EDX
  • OI Ultim Extreme EDX
  • OI Symmetry S2 EBSD 

Available techniques